Product Name: Metallographic Microscope
Product model: BX51M-IR
Product manufacturer: OLYMPUS
Brief introduction:
The BX51IR microscope can perform non-destructive examination and analysis on areas that are not visible to the naked eye, as well as a specialized microscope for near-infrared observation. Able to perform non-destructive CPS bumping observations on the interior of semiconductor chips and the back of integrated circuit components.
Detailed introduction of metallographic microscope:
Olympus scientific grade upright system microscope BX51/BX51M-IR
1. Microscope for near-infrared external transmission reflection observation
2. 5X to 10X infrared lenses with aberration correction covering the entire wavelength range from visible light to near-infrared
3. Suitable for observing the interior of wafers, compound semiconductors, packaged chips, and CSP bumps
Main features:
1. UIS infinite distance correction optical system provides excellent image quality
2. Further improvement in ergonomics to make operation more comfortable
3. Multiple highly functional attachments that can meet various inspection needs
