Features and advantages
One click switching of radiation sources
Strong testing capabilities and flexible configuration solutions
Multiple scanning modes: spiral, offset, limited angle, etc
Has strong scalability
Technical indicators
resolving power
Pixel detail resolution ability | 200nm |
Spatial resolution* | 500nm |
X射线源
类型 | 开管反射式 | 开管透射式(微焦点/纳焦点) |
最高电压 | 300KV/240KV/225KV/190KV/160KV | 240KV/225KV/190KV/160KV |
平板探测器
成像面积 | 427mm×427mm |
像素矩阵 | 3072×3072 |
样品
可检测样品尺寸 | 600mm×600mm(直径×高度) |
样品承重 | 25kg |
设备物理参数
设备尺寸 | 2770mm×1540mm×2040mm(长×宽×高) |
设备重量 | 8000kg |
*空间分辨率可用空间分辨率测试卡进行测试验证
▲ 技术参数为参考指标，更多规格型号，欢迎来电咨询
